Electrostatic discharges (ESD), latch-up and pad design constraints

Electrostatic discharges (ESD), latch-up and pad design constraints

This paper is tailored to beginners in the field of electrostatic discharges. After a brief introduction, the basics of ESD are first reviewed and followed by a description of the standards devoted to the protection of intregrated circuits. Then, the behavior and modeling of elementary devices under...

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Veröffentlicht in:Microelectronic engineering 1999, Vol.49 (1), p.83-94
Hauptverfasser: Salome, Pascal, Richier, Corinne
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Microelectronic fabrication (materials and surfaces technology)
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Testing, measurement, noise and reliability
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Beschreibung
Zusammenfassung:This paper is tailored to beginners in the field of electrostatic discharges. After a brief introduction, the basics of ESD are first reviewed and followed by a description of the standards devoted to the protection of intregrated circuits. Then, the behavior and modeling of elementary devices under ESD are discussed.
ISSN:0167-9317
1873-5568
DOI:10.1016/S0167-9317(99)00431-1