Growth and characterization of Y2O3:Tm thin-film blue-emitting phosphor
Thulium-doped yttrium oxide (Y2O3:Tm) thin films were grown on amorphous quartz and indium tin oxide glass substrates employing an electron- beam evaporation technique. Structural characterisation was carried out at various substrate and annealing temperatures. Y2O3:Tm was evaluated as a blue- emitt...
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| Veröffentlicht in: | Journal of the Electrochemical Society 1999-11, Vol.146 (11), p.4320-4323 |
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| container_issue | 11 |
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| container_title | Journal of the Electrochemical Society |
| container_volume | 146 |
| creator | NAKANISHI, Y WADA, H KOMINAMI, H KOTTAISAMY, M AOKI, T HATANAKA, Y |
| description | Thulium-doped yttrium oxide (Y2O3:Tm) thin films were grown on amorphous quartz and indium tin oxide glass substrates employing an electron- beam evaporation technique. Structural characterisation was carried out at various substrate and annealing temperatures. Y2O3:Tm was evaluated as a blue- emitting phosphor for field emission display based on its cathode-luminescent spectra, chromaticity, and brightness at low-voltage excitation ( < 5 keV). Sharp emission was observed from thulium at 454 nm. The cathode luminance of the thin films was assessed with respect to substrates and annealing temperatures. The results show that Y2O3:Tm growth on indium tin oxide glass at 500 C followed with annealing at 800 C has the better luminescent properties. 21 refs. |
| doi_str_mv | 10.1149/1.1392634 |
| format | Article |
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Structural characterisation was carried out at various substrate and annealing temperatures. Y2O3:Tm was evaluated as a blue- emitting phosphor for field emission display based on its cathode-luminescent spectra, chromaticity, and brightness at low-voltage excitation ( < 5 keV). Sharp emission was observed from thulium at 454 nm. The cathode luminance of the thin films was assessed with respect to substrates and annealing temperatures. 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Structural characterisation was carried out at various substrate and annealing temperatures. Y2O3:Tm was evaluated as a blue- emitting phosphor for field emission display based on its cathode-luminescent spectra, chromaticity, and brightness at low-voltage excitation ( < 5 keV). Sharp emission was observed from thulium at 454 nm. The cathode luminance of the thin films was assessed with respect to substrates and annealing temperatures. The results show that Y2O3:Tm growth on indium tin oxide glass at 500 C followed with annealing at 800 C has the better luminescent properties. 21 refs.</abstract><cop>Pennington, NJ</cop><pub>Electrochemical Society</pub><doi>10.1149/1.1392634</doi><tpages>4</tpages></addata></record> |
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| issn | 0013-4651 1945-7111 |
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| source | Institute of Physics Journals |
| subjects | Cathodoluminescence, ionoluminescence Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Ion and electron beam-assisted deposition ion plating Materials science Methods of deposition of films and coatings film growth and epitaxy Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Other luminescence and radiative recombination Physics |
| title | Growth and characterization of Y2O3:Tm thin-film blue-emitting phosphor |
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