Growth and characterization of Y2O3:Tm thin-film blue-emitting phosphor

Thulium-doped yttrium oxide (Y2O3:Tm) thin films were grown on amorphous quartz and indium tin oxide glass substrates employing an electron- beam evaporation technique. Structural characterisation was carried out at various substrate and annealing temperatures. Y2O3:Tm was evaluated as a blue- emitting phosphor for field emission display based on its cathode-luminescent spectra, chromaticity, and brightness at low-voltage excitation ( < 5 keV). Sharp emission was observed from thulium at 454 nm. The cathode luminance of the thin films was assessed with respect to substrates and annealing temperatures. The results show that Y2O3:Tm growth on indium tin oxide glass at 500 C followed with annealing at 800 C has the better luminescent properties. 21 refs.