Cadmium zinc telluride substrate growth, characterization, and evaluation

Cadmium zinc telluride substrate growth, characterization, and evaluation

Cadmium zinc telluride substrates were grown by the vertical and horizontal Bridgman techniques, characterized, and evaluated. Evaluation included the fabrication and testing of infrared focal plane arrays. Correlations of substrate defects and FPA performance were made.

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Veröffentlicht in:Journal of electronic materials 1999-06, Vol.28 (6), p.726-731
Hauptverfasser: Kestigian, M., Bollong, A. B., Derby, J. J., Glass, H. L., Harris, K., Hettich, H. L., Liao, P. K., Mitra, P., Norton, P. W., Wadley, H.
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Sprache:eng
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Zusammenfassung:Cadmium zinc telluride substrates were grown by the vertical and horizontal Bridgman techniques, characterized, and evaluated. Evaluation included the fabrication and testing of infrared focal plane arrays. Correlations of substrate defects and FPA performance were made.
ISSN:0361-5235
1543-186X
DOI:10.1007/s11664-999-0061-7