Characterisation of FeBSiC coated MFM tips using Lorentz electron tomography and MFM

Magnetic force microscope (MFM) tips coated with an amorphous ferromagnetic alloy have been studied using MFM and Lorentz electron microscopy. Imaging a standard NIST hard disk sample in the MFM reveals that the character of the tips varies dramatically with film thickness. The stray field distribut...

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Veröffentlicht in:	IEEE transactions on magnetics 1999-09, Vol.35 (5), p.3986-3988
Hauptverfasser:	Scott, J., McVitie, S., Ferrier, R.P., Heydon, G.P., Rainforth, W.M., Gibbs, M.R.J., Tucker, J.W., Davies, H.A., Bishop, J.E.L.
Format:	Artikel
Sprache:	eng
Schlagworte:	Amorphous magnetic materials Amorphous materials Applied sciences Astronomy Condensed matter: electronic structure, electrical, magnetic, and optical properties Disks Electron microscopy Exact sciences and technology Fe and its alloys Ferromagnetism Film thickness Magnetic fields Magnetic force microscopy Magnetic forces Magnetic properties and materials Magnetization Metals. Metallurgy Microscopes NIST Physics Studies of specific magnetic materials Tips Tomography
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Beschreibung
Zusammenfassung:	Magnetic force microscope (MFM) tips coated with an amorphous ferromagnetic alloy have been studied using MFM and Lorentz electron microscopy. Imaging a standard NIST hard disk sample in the MFM reveals that the character of the tips varies dramatically with film thickness. The stray field distributions of the tips were determined using Lorentz electron tomography, and were found to be consistent with the contrast observed by MFM.
ISSN:	0018-9464 1941-0069
DOI:	10.1109/20.800730