Atomic' X-ray absorption fine structure: a new tool for examining electrochemical interfaces

Systematic changes in the magnitude of the atomic X-ray absorption fine structure AXAFS have been observed for the in situ charging of a Pt/C electrode in 0.1 M H 2SO 4. Using cluster calculations with 0.0 and ±0.05 electrons per surface Pt atom it has been possible to quantitatively calculate the c...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Electrochimica acta 1998-12, Vol.44 (8), p.1283-1287
Hauptverfasser:	O'Grady, W.E, Ramaker, D.E
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic XAFS Chemistry Electrochemistry Exact sciences and technology EXAFS General and physical chemistry In situ X-ray absorption spectroscopy Miscellaneous Study of interfaces XAS
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Systematic changes in the magnitude of the atomic X-ray absorption fine structure AXAFS have been observed for the in situ charging of a Pt/C electrode in 0.1 M H 2SO 4. Using cluster calculations with 0.0 and ±0.05 electrons per surface Pt atom it has been possible to quantitatively calculate the changes observed in the AXAFS and explain the source of these changes from an electrochemical point of view.
ISSN:	0013-4686 1873-3859
DOI:	10.1016/S0013-4686(98)00249-7