High resolution X-ray scattering from nanotechnology materials

The application of X-ray scattering to the non-destructive determination of physical properties of nanostructured materials is illustrated through use of three example systems. High resolution parallel beam powder diffraction is used to measure particle size and melting temperature in Sn nanoparticl...

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Veröffentlicht in:	Applied surface science 2001-10, Vol.182 (3), p.202-208
Hauptverfasser:	Tanner, B.K., Hase, T.P.A., Clarke, J., Pape, I., Li-Bassi, A., Fulthorpe, B.D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology High resolution Materials science Nanoscale materials and structures: fabrication and characterization Physics Silica film Solid surfaces and solid-solid interfaces Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) X-ray scattering
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Beschreibung
Zusammenfassung:	The application of X-ray scattering to the non-destructive determination of physical properties of nanostructured materials is illustrated through use of three example systems. High resolution parallel beam powder diffraction is used to measure particle size and melting temperature in Sn nanoparticles while full reciprocal space mapping allows the mosaic distribution of Co in epitaxial Ag films to be determined. The in-plane correlation length associated with steps on Ag surfaces and the period of artificial gratings are measured by grazing incidence scattering.
ISSN:	0169-4332 1873-5584
DOI:	10.1016/S0169-4332(01)00424-X