High coercivity ferrite thin-film tape media for perpendicular recording

Reactive sputtering using an electron–cyclotron-resonance microwave plasma was introduced to prepare ferrite thin-film media at substrate temperatures lower than 150°C without oxidation process after their deposition. The ferrite thin-films deposited on glass substrates had perpendicular magnetic an...

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Veröffentlicht in:	Journal of magnetism and magnetic materials 2001-10, Vol.235 (1), p.342-346
Hauptverfasser:	Yamamoto, Setsuo, Hirata, Kei, Kurisu, Hiroki, Matsuura, Mitsuru, Doi, Takanori, Tamari, Kousaku
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties ECR sputtering Electronics Exact sciences and technology Ferrite thin-film Magnetic and optical mass memories Magnetic properties and materials Magnetic recording materials Perpendicular magnetic anisotropy Perpendicular magnetic recording media Physics Storage and reproduction of information Studies of specific magnetic materials
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Beschreibung
Zusammenfassung:	Reactive sputtering using an electron–cyclotron-resonance microwave plasma was introduced to prepare ferrite thin-film media at substrate temperatures lower than 150°C without oxidation process after their deposition. The ferrite thin-films deposited on glass substrates had perpendicular magnetic anisotropy, high coercivity of about 3000 Oe and very smooth surface. The ferrite thin-films deposited on organic flexible film substrates such as polyimide and PET films also showed perpendicular magnetic anisotropy and high coercivity of 1700–2000 Oe.
ISSN:	0304-8853
DOI:	10.1016/S0304-8853(01)00372-9