FASTEST: A tool for a complete and efficient statistical evaluation of analog circuits. DC analysis
A set of novel techniques are implemented in a CAD tool, FASTEST, which evaluates statistical deviations in the performance characteristics of analog circuits, starting from the statistical deviations in the technological parameters of MOS transistors, achieving more than one order of magnitude CPU...
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Veröffentlicht in: | Analog integrated circuits and signal processing 2001-12, Vol.29 (3), p.201-212 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | A set of novel techniques are implemented in a CAD tool, FASTEST, which evaluates statistical deviations in the performance characteristics of analog circuits, starting from the statistical deviations in the technological parameters of MOS transistors, achieving more than one order of magnitude CPU time reduction. A description of techniques for DC specifications is presented herein. The tool performance is demonstrated via the analysis of a multiple current mirror and two different CMOS transconductors. The CPU time is reduced by a factor from 10 to 27 with respect to conventional Monte Carlo analysis of electrical simulations, while maintaining similar accuracy in the computations. |
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ISSN: | 0925-1030 |
DOI: | 10.1023/A:1011265531099 |