Real surface determination of Co sub(3)O sub(4) by Zn super(2+) adsorption. A comparison between x-ray diffraction, cyclic voltammetry and adsorption methods

Real surface determination of Co sub(3)O sub(4) by Zn super(2+) adsorption. A comparison between x-ray diffraction, cyclic voltammetry and adsorption methods

The real surface areas of Co sub(3)O sub(4) films have been measured by Zn super(2+) adsorption. Co sub(3)O sub(4) films have been prepared by spray pyrolysis. The results are compared with crystallite sizes obtained by X-ray diffraction measurements and roughness factors calculated from cyclic volt...

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Veröffentlicht in:Electrochimica acta 1998-01, Vol.43 (8), p.893-898
Hauptverfasser: Nkeng, P, Marlier, S, Koenig, J F, Chartier, P, Poillerat, G, Gautier, J-L
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creator Nkeng, P
Marlier, S
Koenig, J F
Chartier, P
Poillerat, G
Gautier, J-L
description The real surface areas of Co sub(3)O sub(4) films have been measured by Zn super(2+) adsorption. Co sub(3)O sub(4) films have been prepared by spray pyrolysis. The results are compared with crystallite sizes obtained by X-ray diffraction measurements and roughness factors calculated from cyclic voltammograms. Discrepancies between the three methods are discussed and examined.
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fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_miscellaneous_26741338</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>26741338</sourcerecordid><originalsourceid>FETCH-proquest_miscellaneous_267413383</originalsourceid><addsrcrecordid>eNqNjL1OxDAQhF2AxPHzDluhiyDId46Sa9EJRId0oqI5bey1MPJP8DpAHoZ3JYcoKKlGM_PNHImFlCtVN-2mPRGnzK9Syq7t5EJ87Qg98JgtagJDhXJwEYtLEZKFbZq7fqmqxx9tKugneI6zGSgv11cVoOGUhwN_A7egUxgwO57XPZUPogifdcYJjLM2oz5w16An7Z2G9-QLhkAlT4DR_LmCOXxJhs_FsUXPdPGrZ-Ly_u5p-1APOb2NxGUfHGvyHiOlkffrtmtWSm3Uv8Fv2KdclQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>26741338</pqid></control><display><type>article</type><title>Real surface determination of Co sub(3)O sub(4) by Zn super(2+) adsorption. A comparison between x-ray diffraction, cyclic voltammetry and adsorption methods</title><source>Elsevier ScienceDirect Journals</source><creator>Nkeng, P ; Marlier, S ; Koenig, J F ; Chartier, P ; Poillerat, G ; Gautier, J-L</creator><creatorcontrib>Nkeng, P ; Marlier, S ; Koenig, J F ; Chartier, P ; Poillerat, G ; Gautier, J-L</creatorcontrib><description>The real surface areas of Co sub(3)O sub(4) films have been measured by Zn super(2+) adsorption. Co sub(3)O sub(4) films have been prepared by spray pyrolysis. The results are compared with crystallite sizes obtained by X-ray diffraction measurements and roughness factors calculated from cyclic voltammograms. Discrepancies between the three methods are discussed and examined.</description><identifier>ISSN: 0013-4686</identifier><language>eng</language><ispartof>Electrochimica acta, 1998-01, Vol.43 (8), p.893-898</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780</link.rule.ids></links><search><creatorcontrib>Nkeng, P</creatorcontrib><creatorcontrib>Marlier, S</creatorcontrib><creatorcontrib>Koenig, J F</creatorcontrib><creatorcontrib>Chartier, P</creatorcontrib><creatorcontrib>Poillerat, G</creatorcontrib><creatorcontrib>Gautier, J-L</creatorcontrib><title>Real surface determination of Co sub(3)O sub(4) by Zn super(2+) adsorption. A comparison between x-ray diffraction, cyclic voltammetry and adsorption methods</title><title>Electrochimica acta</title><description>The real surface areas of Co sub(3)O sub(4) films have been measured by Zn super(2+) adsorption. Co sub(3)O sub(4) films have been prepared by spray pyrolysis. The results are compared with crystallite sizes obtained by X-ray diffraction measurements and roughness factors calculated from cyclic voltammograms. Discrepancies between the three methods are discussed and examined.</description><issn>0013-4686</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><recordid>eNqNjL1OxDAQhF2AxPHzDluhiyDId46Sa9EJRId0oqI5bey1MPJP8DpAHoZ3JYcoKKlGM_PNHImFlCtVN-2mPRGnzK9Syq7t5EJ87Qg98JgtagJDhXJwEYtLEZKFbZq7fqmqxx9tKugneI6zGSgv11cVoOGUhwN_A7egUxgwO57XPZUPogifdcYJjLM2oz5w16An7Z2G9-QLhkAlT4DR_LmCOXxJhs_FsUXPdPGrZ-Ly_u5p-1APOb2NxGUfHGvyHiOlkffrtmtWSm3Uv8Fv2KdclQ</recordid><startdate>19980101</startdate><enddate>19980101</enddate><creator>Nkeng, P</creator><creator>Marlier, S</creator><creator>Koenig, J F</creator><creator>Chartier, P</creator><creator>Poillerat, G</creator><creator>Gautier, J-L</creator><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19980101</creationdate><title>Real surface determination of Co sub(3)O sub(4) by Zn super(2+) adsorption. A comparison between x-ray diffraction, cyclic voltammetry and adsorption methods</title><author>Nkeng, P ; Marlier, S ; Koenig, J F ; Chartier, P ; Poillerat, G ; Gautier, J-L</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_miscellaneous_267413383</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nkeng, P</creatorcontrib><creatorcontrib>Marlier, S</creatorcontrib><creatorcontrib>Koenig, J F</creatorcontrib><creatorcontrib>Chartier, P</creatorcontrib><creatorcontrib>Poillerat, G</creatorcontrib><creatorcontrib>Gautier, J-L</creatorcontrib><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Electrochimica acta</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nkeng, P</au><au>Marlier, S</au><au>Koenig, J F</au><au>Chartier, P</au><au>Poillerat, G</au><au>Gautier, J-L</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Real surface determination of Co sub(3)O sub(4) by Zn super(2+) adsorption. A comparison between x-ray diffraction, cyclic voltammetry and adsorption methods</atitle><jtitle>Electrochimica acta</jtitle><date>1998-01-01</date><risdate>1998</risdate><volume>43</volume><issue>8</issue><spage>893</spage><epage>898</epage><pages>893-898</pages><issn>0013-4686</issn><abstract>The real surface areas of Co sub(3)O sub(4) films have been measured by Zn super(2+) adsorption. Co sub(3)O sub(4) films have been prepared by spray pyrolysis. The results are compared with crystallite sizes obtained by X-ray diffraction measurements and roughness factors calculated from cyclic voltammograms. Discrepancies between the three methods are discussed and examined.</abstract></addata></record>
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title Real surface determination of Co sub(3)O sub(4) by Zn super(2+) adsorption. A comparison between x-ray diffraction, cyclic voltammetry and adsorption methods
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T04%3A34%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Real%20surface%20determination%20of%20Co%20sub(3)O%20sub(4)%20by%20Zn%20super(2+)%20adsorption.%20A%20comparison%20between%20x-ray%20diffraction,%20cyclic%20voltammetry%20and%20adsorption%20methods&rft.jtitle=Electrochimica%20acta&rft.au=Nkeng,%20P&rft.date=1998-01-01&rft.volume=43&rft.issue=8&rft.spage=893&rft.epage=898&rft.pages=893-898&rft.issn=0013-4686&rft_id=info:doi/&rft_dat=%3Cproquest%3E26741338%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=26741338&rft_id=info:pmid/&rfr_iscdi=true