Determining oxide growth in thermal barrier coatings (TBCs) non-destructively using impedance spectroscopy

It is demonstrated that impedance spectroscopy can effectively separate electrical responses from different oxide layers in thermal barrier coatings (TBCs). The modulus measurement is a powerful nondestructive method for monitoring oxide layer growth in TBCs. (CSA)

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Bibliographische Detailangaben
Veröffentlicht in:	Journal of materials science letters 2001, Vol.20 (1), p.47-49
Hauptverfasser:	Wang, Xin, Mei, Junfa, Xiao, Ping
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Diffusion interface formation Exact sciences and technology Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties Materials science Materials testing Metals. Metallurgy Methods of materials testing and analysis Nonmetallic coatings Physics Production techniques Solid surfaces and solid-solid interfaces Surface treatment Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
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Beschreibung
Zusammenfassung:	It is demonstrated that impedance spectroscopy can effectively separate electrical responses from different oxide layers in thermal barrier coatings (TBCs). The modulus measurement is a powerful nondestructive method for monitoring oxide layer growth in TBCs. (CSA)
ISSN:	0261-8028
DOI:	10.1023/A:1006710714273