Magnetic phase transition in amorphous Cr/TbDyFe thin-film multilayers

The Magnetic phase transition in amorphous thin-film multilayers is investigated, for the first time, by deducing the critical exponents using the conventional techniques to analyze phase transitions, e.g., the Modified Arrott Plots, Kouvel-Fisher Method, Scaling Equation of State Analysis and the critical isotherm at the Curie point. The magnetic phase transition in this material is characterized by the critical exponent values close to those corresponding to the three-dimensional Heisenberg spin system with nearest-neighbor interactions.