Hole diffusion length and temperature dependence of photovoltages for n-Si electrodes modified with LB layers of ultrafine platinum particles
The mechanism of generation of high open-circuit photovoltages ( V oc s) of 0.62–0.63 V for n-Si (~ 1 Ω cm) electrodes modified with colloidal Pt particles (4 nm in diameter) is investigated by measurements of minority-carrier (hole) diffusion length ( L p ) and temperature dependence of V oc . Lang...
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Veröffentlicht in: | Electrochimica acta 1997, Vol.42 (3), p.431-437 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The mechanism of generation of high open-circuit photovoltages (
V
oc
s) of 0.62–0.63 V for
n-Si (~ 1 Ω cm) electrodes modified with colloidal Pt particles (4 nm in diameter) is investigated by measurements of minority-carrier (hole) diffusion length (
L
p
) and temperature dependence of
V
oc
. Langmuir-Blodgett (LB) layers of colloidal Pt particles are used to control the Pt density on
n-Si. The
L
p
value is determined to be 200 μm, irrespective of whether
n-Si is modified with Pt or not. The temperature dependences of
V
oc
s at 203–298 K have been explained well by our previously proposed model. It is shown that heat treatments of the Pt-modified
n-Si electrodes increase the area and the width of the direct Pt-Si contacts and thus decrease
V
oc
, but minority-carrier controlled (ideal) solar cells are obtained if the electrodes are prepared under appropriate conditions. |
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ISSN: | 0013-4686 1873-3859 |
DOI: | 10.1016/S0013-4686(96)00238-1 |