Accurate and efficient macromodel of submicron digital standard cells

In this paper a new analytic gate delay modelingtechnique is presented that allows to accuratelyreproduce the timing behavior of deep submicron digitalstandard cells for a large range of operating conditions.The proposed technique sensibly improves the accuracyof the existing analytic delay models and it usuallyrequires less simulations for the cell characterization.Moreover it is compatible with the most advanced interconnectdelay models that have been recently proposed inthe literature.