X-Ray Strain Analysis of Quenched and Ground Alumina Samples

The contribution illustrates some of the possibilities of X-ray diffraction measurements of residual stresses due to a thermal or mechanical treatment of engineering ceramics. The lattice strains were determined by means of CrK-alpha and CuK-alpha radiations, which have different effective penetration depths in the investigated material. This way stress gradients have been identified in the surface layers of the measured samples. (Author)