Microstructure and texture of pitch-based carbon fibers after creep deformation

The internal microstructure of new high modulus, pitch-based, post-creep carbon filaments is compared to that as-received and is similarly compared to post-creep and as-received PAN-based filaments. The structure of the carbon filaments is studied using several techniques: electron diffraction, scanning electron microscopy, transmission electron microscopy, and X-ray diffraction.