Electron spectroscopy for chemical analysis studies on electron beam evaporated CuOx thin films

Electron spectroscopy for chemical analysis studies has been carried out on CuOx films deposited onto yttria-stabilized zirconia single crystal substrates by electron beam evaporation under molecular beam epitaxy conditions. The results showed that copper oxide dissociated under electron beam heatin...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Thin solid films 1994-09, Vol.249 (2), p.140-143
Hauptverfasser: KOTHIYAL, G. P, MUTHE, K. P, VYAS, J. C, GANDHI, D. P, HANDU, V. K, SINGH, K. D, SABHARWAL, S. C, GUPTA, M. K
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Electron spectroscopy for chemical analysis studies has been carried out on CuOx films deposited onto yttria-stabilized zirconia single crystal substrates by electron beam evaporation under molecular beam epitaxy conditions. The results showed that copper oxide dissociated under electron beam heating in high vacuum and the reassociation of copper and oxygen to form suboxide (CuOx) at the substrate was a function of its temperature. The maximum oxygen content was found to be about 46 percent of the starting source material at the growth temperature of 500 C, above which the CuOx film started to decompose.
ISSN:0040-6090
1879-2731
DOI:10.1016/0040-6090(94)90751-X