Use of neural networks for LPCVD reactors modelling

In this paper an alternative approach to LPCVD modelling is presented. The reactor has been broken up into a number of basic elements. A neural network has been elaborated to represent this basic element. The objective is to provide a simulation model which can be used to compute on-line the film th...

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Veröffentlicht in:Computers & chemical engineering 1996, Vol.20, p.S521-S526
Hauptverfasser: Fakhr-Eddine, K., Cabassud, M., Duverneuil, P., Le Lann, M.V., Couderc, J.P.
Format: Artikel
Sprache:eng
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Zusammenfassung:In this paper an alternative approach to LPCVD modelling is presented. The reactor has been broken up into a number of basic elements. A neural network has been elaborated to represent this basic element. The objective is to provide a simulation model which can be used to compute on-line the film thickness on each wafer in order to develop a controller of LPCVD reactors.
ISSN:0098-1354
1873-4375
DOI:10.1016/0098-1354(96)00096-8