Use of neural networks for LPCVD reactors modelling
In this paper an alternative approach to LPCVD modelling is presented. The reactor has been broken up into a number of basic elements. A neural network has been elaborated to represent this basic element. The objective is to provide a simulation model which can be used to compute on-line the film th...
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Veröffentlicht in: | Computers & chemical engineering 1996, Vol.20, p.S521-S526 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | In this paper an alternative approach to LPCVD modelling is presented. The reactor has been broken up into a number of basic elements. A neural network has been elaborated to represent this basic element. The objective is to provide a simulation model which can be used to compute on-line the film thickness on each wafer in order to develop a controller of LPCVD reactors. |
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ISSN: | 0098-1354 1873-4375 |
DOI: | 10.1016/0098-1354(96)00096-8 |