Extended X-ray absorption fine structure studies of luminescent centers in II-VI thin films

EXAFS was used to determine local structure of luminescence centers in doped sulfide thin films for electroluminescent displays. Tb sup 3 sup + forms polycations of TbO sup + in ZnS. Sputtered ZnS films had strong structural disorder relative to atomic layer epitaxial films.

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Bibliographische Detailangaben
Veröffentlicht in:	Journal of the Electrochemical Society 1993-07, Vol.140 (7), p.2015-2019
Hauptverfasser:	CHARREIRE, Y, SVORONOS, D.-R, ASCONE, I, TOLONEN, O, NIINISTÖ, L, LESKELÄ, M
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physical properties of thin films, nonelectronic Physics Solid surfaces and solid-solid interfaces Surface energy thermodynamic properties Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
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Beschreibung
Zusammenfassung:	EXAFS was used to determine local structure of luminescence centers in doped sulfide thin films for electroluminescent displays. Tb sup 3 sup + forms polycations of TbO sup + in ZnS. Sputtered ZnS films had strong structural disorder relative to atomic layer epitaxial films.
ISSN:	0013-4651 1945-7111
DOI:	10.1149/1.2220754