Reliability growth in the probability and possibility contexts
In this paper we focus on the software reliability growth. All reliability characteristics are described in terms of probability and possibility measures. The mathematical models of the reliability growth are based on the systems of integral and functional equations.
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| Veröffentlicht in: | Microelectronics and reliability 1996, Vol.36 (9), p.1155-1166 |
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| container_end_page | 1166 |
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| container_issue | 9 |
| container_start_page | 1155 |
| container_title | Microelectronics and reliability |
| container_volume | 36 |
| creator | Utkin, L.V. Gurov, S.V. Shubinsky, M.I. |
| description | In this paper we focus on the software reliability growth. All reliability characteristics are described in terms of probability and possibility measures. The mathematical models of the reliability growth are based on the systems of integral and functional equations. |
| doi_str_mv | 10.1016/0026-2714(95)00179-4 |
| format | Article |
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| ispartof | Microelectronics and reliability, 1996, Vol.36 (9), p.1155-1166 |
| issn | 0026-2714 1872-941X |
| language | eng |
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| source | Elsevier ScienceDirect Journals Complete |
| title | Reliability growth in the probability and possibility contexts |
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