Reliability growth in the probability and possibility contexts

In this paper we focus on the software reliability growth. All reliability characteristics are described in terms of probability and possibility measures. The mathematical models of the reliability growth are based on the systems of integral and functional equations.

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Bibliographische Detailangaben
Veröffentlicht in:	Microelectronics and reliability 1996, Vol.36 (9), p.1155-1166
Hauptverfasser:	Utkin, L.V., Gurov, S.V., Shubinsky, M.I.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	In this paper we focus on the software reliability growth. All reliability characteristics are described in terms of probability and possibility measures. The mathematical models of the reliability growth are based on the systems of integral and functional equations.
ISSN:	0026-2714 1872-941X
DOI:	10.1016/0026-2714(95)00179-4