Twinning study of CdTe epitaxic by X-ray phi -scan measurement

Twinning study of CdTe epitaxic by X-ray phi -scan measurement

A new application of an X-ray phi -scan setup is presented. The application of this system to twinned crystals is described. The X-ray scan diffraction pattern can show twins in the crystal studies to a very good precision. The ratio between the twin diffraction peaks and those from the crystal matr...

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Veröffentlicht in:Journal of applied crystallography 1993-08, Vol.26, p.570-573
Hauptverfasser: Brizard, Chrisstine, Rolland, Guy, Laugier, Frederic
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container_title Journal of applied crystallography
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creator Brizard, Chrisstine
Rolland, Guy
Laugier, Frederic
description A new application of an X-ray phi -scan setup is presented. The application of this system to twinned crystals is described. The X-ray scan diffraction pattern can show twins in the crystal studies to a very good precision. The ratio between the twin diffraction peaks and those from the crystal matrix gives the twin yield. This method is a great deal faster and more precise than the previous one use to study twins, which consisted of recording successively the various diffraction peaks of a chosen plane on a simple diffraction setup.
doi_str_mv 10.1107/S0021889893001517
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title Twinning study of CdTe epitaxic by X-ray phi -scan measurement
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