Twinning study of CdTe epitaxic by X-ray phi -scan measurement

A new application of an X-ray phi -scan setup is presented. The application of this system to twinned crystals is described. The X-ray scan diffraction pattern can show twins in the crystal studies to a very good precision. The ratio between the twin diffraction peaks and those from the crystal matrix gives the twin yield. This method is a great deal faster and more precise than the previous one use to study twins, which consisted of recording successively the various diffraction peaks of a chosen plane on a simple diffraction setup.