Neutron reflection studies of phase separation and transesterification in thin film polymer blends
Neutron reflection is used to investigate the evolution of structure and surface segregation in thin films of a binary polymer blend, deuterated polymethamethacrylate (dPMMA) and polycarbonate (PC). This blend film simultaneously undergoes phase separation and reaction by trans-esterification. A lar...
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| Veröffentlicht in: | Physica. B, Condensed matter Condensed matter, 1996-04, Vol.221 (1), p.301-305 |
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| container_issue | 1 |
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| container_title | Physica. B, Condensed matter |
| container_volume | 221 |
| creator | Wong, Apollo P.Y. Karim, Alamgir Han, Charles C. |
| description | Neutron reflection is used to investigate the evolution of structure and surface segregation in thin films of a binary polymer blend, deuterated polymethamethacrylate (dPMMA) and polycarbonate (PC). This blend film simultaneously undergoes phase separation and reaction by trans-esterification. A large increase of the critical scattering length density in the first few minutes of annealing at 200°C reflected the rapid layering of the dPMMA at the silicon surface. Further annealing progressively smeared out the specular peak in favor of the off-specular signal in the form of a butterfly pattern reflecting the in-plane anisotropy of the thin film phase separation. |
| doi_str_mv | 10.1016/0921-4526(95)00941-8 |
| format | Article |
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| issn | 0921-4526 1873-2135 |
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| title | Neutron reflection studies of phase separation and transesterification in thin film polymer blends |
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