Neutron reflection studies of phase separation and transesterification in thin film polymer blends
Neutron reflection is used to investigate the evolution of structure and surface segregation in thin films of a binary polymer blend, deuterated polymethamethacrylate (dPMMA) and polycarbonate (PC). This blend film simultaneously undergoes phase separation and reaction by trans-esterification. A lar...
Gespeichert in:
Veröffentlicht in: | Physica. B, Condensed matter Condensed matter, 1996-04, Vol.221 (1), p.301-305 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Neutron reflection is used to investigate the evolution of structure and surface segregation in thin films of a binary polymer blend, deuterated polymethamethacrylate (dPMMA) and polycarbonate (PC). This blend film simultaneously undergoes phase separation and reaction by trans-esterification. A large increase of the critical scattering length density in the first few minutes of annealing at 200°C reflected the rapid layering of the dPMMA at the silicon surface. Further annealing progressively smeared out the specular peak in favor of the off-specular signal in the form of a butterfly pattern reflecting the in-plane anisotropy of the thin film phase separation. |
---|---|
ISSN: | 0921-4526 1873-2135 |
DOI: | 10.1016/0921-4526(95)00941-8 |