Neutron reflection studies of phase separation and transesterification in thin film polymer blends

Neutron reflection is used to investigate the evolution of structure and surface segregation in thin films of a binary polymer blend, deuterated polymethamethacrylate (dPMMA) and polycarbonate (PC). This blend film simultaneously undergoes phase separation and reaction by trans-esterification. A lar...

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Veröffentlicht in:Physica. B, Condensed matter Condensed matter, 1996-04, Vol.221 (1), p.301-305
Hauptverfasser: Wong, Apollo P.Y., Karim, Alamgir, Han, Charles C.
Format: Artikel
Sprache:eng
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Zusammenfassung:Neutron reflection is used to investigate the evolution of structure and surface segregation in thin films of a binary polymer blend, deuterated polymethamethacrylate (dPMMA) and polycarbonate (PC). This blend film simultaneously undergoes phase separation and reaction by trans-esterification. A large increase of the critical scattering length density in the first few minutes of annealing at 200°C reflected the rapid layering of the dPMMA at the silicon surface. Further annealing progressively smeared out the specular peak in favor of the off-specular signal in the form of a butterfly pattern reflecting the in-plane anisotropy of the thin film phase separation.
ISSN:0921-4526
1873-2135
DOI:10.1016/0921-4526(95)00941-8