A STM study on compared chemical reactivities of different Si(111) surfaces: copper growth and ferrocene adsorption
As an illustration of our activities in the domain of near field microscopies, we present a comparative STM study on Cu and ferrocene adsorption on different Si(111) surfaces: B-Si(111) √3 x √3 R(30°) with various concentration of boron and a Si(111) 7 x 7. We show that √3 phases of boron doped surf...
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Veröffentlicht in: | Microscopy microanalysis microstructures (Les Ulis) 1993-10, Vol.4 (5), p.419-427 |
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Sprache: | eng |
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Zusammenfassung: | As an illustration of our activities in the domain of near field microscopies, we present a comparative STM study on Cu and ferrocene adsorption on different Si(111) surfaces: B-Si(111) √3 x √3 R(30°) with various concentration of boron and a Si(111) 7 x 7. We show that √3 phases of boron doped surfaces are relatively chemical inert. We thus correlate the surface reactivity with the density of outer Si dangling bonds.
Comme illustration de nos activités dans le domaine de la microscopie de champ proche, nous présentons une étude comparative de l'adsorption du cuivre et du ferrocène sur différentes surfaces de Si(111): B-Si(111) √3 x √3 R(30°) de concentration en bore variable et Si(111) 7 × 7. Nous montrons que la phase √3 de la surface dopée au bore est chimiquement relativement inerte. Nous corrélons la réactivité de surface à la densité de liaisons pendantes à la surface du silicium. |
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ISSN: | 1154-2799 |
DOI: | 10.1051/mmm:0199300405041900 |