On basal slip and basal twinning in sapphire (α-Al 2O 3)—III. HRTEM of the twin/matrix interface
A high resolution transmission electron microscopy (HRTEM) investigation of basal twins in sapphire (α-Al 2O 3) indicates that they are either Type-II or Type-I “glide” twins with a shear of 1/3 [101¯0〉 (the latter type twin is also equivalent to a Type-II screw twin with reverse shear, 1/3 [1¯010〉)...
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Veröffentlicht in: | Acta materialia 1996-05, Vol.44 (5), p.2165-2174 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A high resolution transmission electron microscopy (HRTEM) investigation of basal twins in sapphire (α-Al
2O
3) indicates that they are either Type-II or Type-I “glide” twins with a shear of 1/3 [101¯0〉 (the latter type twin is also equivalent to a Type-II screw twin with reverse shear, 1/3 [1¯010〉). These two types cannot be distinguished with the resolution of the HRTEM used in the present study. However, a Type-II twin is consistent with the model of basal twinning presented in the second paper of this series, with an AC′BA′CB′/a′bc′ab′c stacking sequence for the Al
O
Al layers along a direction perpendicular to the twin/matrix interface, and pair potential calculations suggest that Type-II interfaces have the lowest energy of all possible twin interfaces in sapphire.
An overlap of the twin/matrix leads to Moire´-like contrast features. This can also be explained with the proposed twinning mechanism. |
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ISSN: | 1359-6454 1873-2453 |
DOI: | 10.1016/1359-6454(95)00288-X |