Suboptical wavelength position measurement of moving atoms using optical fields

We demonstrate all-optical techniques for position measurement and localization of moving atoms with suboptical wavelength precision. Spatial resolution of 200 nanometers, with linearity over a few microns, is obtained by the methods which ultimately will scale to yield nanometer resolution limited...

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Veröffentlicht in:Physical review letters 1993-05, Vol.70 (22), p.3404-3407
Hauptverfasser: GARDNER, J. R, MARABLE, M. L, WELCH, G. R, THOMAS, J. E
Format: Artikel
Sprache:eng
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Zusammenfassung:We demonstrate all-optical techniques for position measurement and localization of moving atoms with suboptical wavelength precision. Spatial resolution of 200 nanometers, with linearity over a few microns, is obtained by the methods which ultimately will scale to yield nanometer resolution limited by the uncertainty principle. (Author)
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.70.3404