Suboptical wavelength position measurement of moving atoms using optical fields
We demonstrate all-optical techniques for position measurement and localization of moving atoms with suboptical wavelength precision. Spatial resolution of 200 nanometers, with linearity over a few microns, is obtained by the methods which ultimately will scale to yield nanometer resolution limited...
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Veröffentlicht in: | Physical review letters 1993-05, Vol.70 (22), p.3404-3407 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | We demonstrate all-optical techniques for position measurement and localization of moving atoms with suboptical wavelength precision. Spatial resolution of 200 nanometers, with linearity over a few microns, is obtained by the methods which ultimately will scale to yield nanometer resolution limited by the uncertainty principle. (Author) |
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ISSN: | 0031-9007 1079-7114 |
DOI: | 10.1103/PhysRevLett.70.3404 |