Temperature-Dependent Bending Rigidity of AB-Stacked Bilayer Graphene

Temperature-Dependent Bending Rigidity of AB-Stacked Bilayer Graphene

The change in bending rigidity with temperature κ(T) for 2D materials is highly debated: theoretical works predict both increase and decrease. Here we present measurements of κ(T), for a 2D material: AB-stacked bilayer graphene. We obtain κ(T) from phonon dispersion curves measured with helium atom...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Physical review letters 2021-12, Vol.127 (26), p.266102-266102
Hauptverfasser: Eder, S D, Hellner, S K, Forti, S, Nordbotten, J M, Manson, J R, Coletti, C, Holst, B
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 266102
container_issue 26
container_start_page 266102
container_title Physical review letters
container_volume 127
creator Eder, S D
Hellner, S K
Forti, S
Nordbotten, J M
Manson, J R
Coletti, C
Holst, B
description The change in bending rigidity with temperature κ(T) for 2D materials is highly debated: theoretical works predict both increase and decrease. Here we present measurements of κ(T), for a 2D material: AB-stacked bilayer graphene. We obtain κ(T) from phonon dispersion curves measured with helium atom scattering in the temperature range 320-400 K. We find that the bending rigidity increases with temperature. Assuming a linear dependence over the measured temperature region we obtain κ(T)=[(1.3±0.1)+(0.006±0.001)T/K]  eV by fitting the data. We discuss this result in the context of existing predictions and room temperature measurements.
doi_str_mv 10.1103/PhysRevLett.127.266102
format Article
fullrecord <record><control><sourceid>proquest_pubme</sourceid><recordid>TN_cdi_proquest_miscellaneous_2620082652</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2620082652</sourcerecordid><originalsourceid>FETCH-LOGICAL-p211t-f4a499d45a633c95b68784dd09333bc8b0d21b9ce6955689b469fe474536933f3</originalsourceid><addsrcrecordid>eNo1z09PwjAcxvHGxAiib4Hs6GXY_2uPgIAmJBrE89Ktv0F1G7PtTPbuJRFP38snT_IgNCV4Rghmj2_HIezgZwsxzgjNZlRKgukVGhOc6TQjhI_QbQifGGNCpbpBIyYw1VzpMVrtoenAm9h7SJ-gg9ZCG5PFua49JDt3cNbFITlVyXyRvkdTfoFNFq42A_hk4013hBbu0HVl6gD3l07Qx3q1Xz6n29fNy3K-TTtKSEwrbrjWlgsjGSu1KKTKFLcWa8ZYUaoCW0oKXYLUQkilCy51BTzjgskzqdgEPfztdv703UOIeeNCCXVtWjj1IaeSYqyoFPRMpxfaFw3YvPOuMX7I_6-zXxLwWpY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2620082652</pqid></control><display><type>article</type><title>Temperature-Dependent Bending Rigidity of AB-Stacked Bilayer Graphene</title><source>American Physical Society Journals</source><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><creator>Eder, S D ; Hellner, S K ; Forti, S ; Nordbotten, J M ; Manson, J R ; Coletti, C ; Holst, B</creator><creatorcontrib>Eder, S D ; Hellner, S K ; Forti, S ; Nordbotten, J M ; Manson, J R ; Coletti, C ; Holst, B</creatorcontrib><description>The change in bending rigidity with temperature κ(T) for 2D materials is highly debated: theoretical works predict both increase and decrease. Here we present measurements of κ(T), for a 2D material: AB-stacked bilayer graphene. We obtain κ(T) from phonon dispersion curves measured with helium atom scattering in the temperature range 320-400 K. We find that the bending rigidity increases with temperature. Assuming a linear dependence over the measured temperature region we obtain κ(T)=[(1.3±0.1)+(0.006±0.001)T/K]  eV by fitting the data. We discuss this result in the context of existing predictions and room temperature measurements.</description><identifier>EISSN: 1079-7114</identifier><identifier>DOI: 10.1103/PhysRevLett.127.266102</identifier><identifier>PMID: 35029489</identifier><language>eng</language><publisher>United States</publisher><ispartof>Physical review letters, 2021-12, Vol.127 (26), p.266102-266102</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/35029489$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Eder, S D</creatorcontrib><creatorcontrib>Hellner, S K</creatorcontrib><creatorcontrib>Forti, S</creatorcontrib><creatorcontrib>Nordbotten, J M</creatorcontrib><creatorcontrib>Manson, J R</creatorcontrib><creatorcontrib>Coletti, C</creatorcontrib><creatorcontrib>Holst, B</creatorcontrib><title>Temperature-Dependent Bending Rigidity of AB-Stacked Bilayer Graphene</title><title>Physical review letters</title><addtitle>Phys Rev Lett</addtitle><description>The change in bending rigidity with temperature κ(T) for 2D materials is highly debated: theoretical works predict both increase and decrease. Here we present measurements of κ(T), for a 2D material: AB-stacked bilayer graphene. We obtain κ(T) from phonon dispersion curves measured with helium atom scattering in the temperature range 320-400 K. We find that the bending rigidity increases with temperature. Assuming a linear dependence over the measured temperature region we obtain κ(T)=[(1.3±0.1)+(0.006±0.001)T/K]  eV by fitting the data. We discuss this result in the context of existing predictions and room temperature measurements.</description><issn>1079-7114</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNo1z09PwjAcxvHGxAiib4Hs6GXY_2uPgIAmJBrE89Ktv0F1G7PtTPbuJRFP38snT_IgNCV4Rghmj2_HIezgZwsxzgjNZlRKgukVGhOc6TQjhI_QbQifGGNCpbpBIyYw1VzpMVrtoenAm9h7SJ-gg9ZCG5PFua49JDt3cNbFITlVyXyRvkdTfoFNFq42A_hk4013hBbu0HVl6gD3l07Qx3q1Xz6n29fNy3K-TTtKSEwrbrjWlgsjGSu1KKTKFLcWa8ZYUaoCW0oKXYLUQkilCy51BTzjgskzqdgEPfztdv703UOIeeNCCXVtWjj1IaeSYqyoFPRMpxfaFw3YvPOuMX7I_6-zXxLwWpY</recordid><startdate>20211224</startdate><enddate>20211224</enddate><creator>Eder, S D</creator><creator>Hellner, S K</creator><creator>Forti, S</creator><creator>Nordbotten, J M</creator><creator>Manson, J R</creator><creator>Coletti, C</creator><creator>Holst, B</creator><scope>NPM</scope><scope>7X8</scope></search><sort><creationdate>20211224</creationdate><title>Temperature-Dependent Bending Rigidity of AB-Stacked Bilayer Graphene</title><author>Eder, S D ; Hellner, S K ; Forti, S ; Nordbotten, J M ; Manson, J R ; Coletti, C ; Holst, B</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p211t-f4a499d45a633c95b68784dd09333bc8b0d21b9ce6955689b469fe474536933f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Eder, S D</creatorcontrib><creatorcontrib>Hellner, S K</creatorcontrib><creatorcontrib>Forti, S</creatorcontrib><creatorcontrib>Nordbotten, J M</creatorcontrib><creatorcontrib>Manson, J R</creatorcontrib><creatorcontrib>Coletti, C</creatorcontrib><creatorcontrib>Holst, B</creatorcontrib><collection>PubMed</collection><collection>MEDLINE - Academic</collection><jtitle>Physical review letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Eder, S D</au><au>Hellner, S K</au><au>Forti, S</au><au>Nordbotten, J M</au><au>Manson, J R</au><au>Coletti, C</au><au>Holst, B</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Temperature-Dependent Bending Rigidity of AB-Stacked Bilayer Graphene</atitle><jtitle>Physical review letters</jtitle><addtitle>Phys Rev Lett</addtitle><date>2021-12-24</date><risdate>2021</risdate><volume>127</volume><issue>26</issue><spage>266102</spage><epage>266102</epage><pages>266102-266102</pages><eissn>1079-7114</eissn><abstract>The change in bending rigidity with temperature κ(T) for 2D materials is highly debated: theoretical works predict both increase and decrease. Here we present measurements of κ(T), for a 2D material: AB-stacked bilayer graphene. We obtain κ(T) from phonon dispersion curves measured with helium atom scattering in the temperature range 320-400 K. We find that the bending rigidity increases with temperature. Assuming a linear dependence over the measured temperature region we obtain κ(T)=[(1.3±0.1)+(0.006±0.001)T/K]  eV by fitting the data. We discuss this result in the context of existing predictions and room temperature measurements.</abstract><cop>United States</cop><pmid>35029489</pmid><doi>10.1103/PhysRevLett.127.266102</doi><tpages>1</tpages></addata></record>
fulltext fulltext
identifier EISSN: 1079-7114
ispartof Physical review letters, 2021-12, Vol.127 (26), p.266102-266102
issn 1079-7114
language eng
recordid cdi_proquest_miscellaneous_2620082652
source American Physical Society Journals; Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals
title Temperature-Dependent Bending Rigidity of AB-Stacked Bilayer Graphene
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T23%3A31%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pubme&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Temperature-Dependent%20Bending%20Rigidity%20of%20AB-Stacked%20Bilayer%20Graphene&rft.jtitle=Physical%20review%20letters&rft.au=Eder,%20S%20D&rft.date=2021-12-24&rft.volume=127&rft.issue=26&rft.spage=266102&rft.epage=266102&rft.pages=266102-266102&rft.eissn=1079-7114&rft_id=info:doi/10.1103/PhysRevLett.127.266102&rft_dat=%3Cproquest_pubme%3E2620082652%3C/proquest_pubme%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2620082652&rft_id=info:pmid/35029489&rfr_iscdi=true