Modelling an imperfect debugging phenomenon in software reliability
Several Software Reliability Growth Models (SRGMs) have been developed in the literature assuming the debugging process to be perfect and thus implying that there is one-to-one correspondence between the number of failures observed and errors removed. However, in reality it is possible that the erro...
Gespeichert in:
| Veröffentlicht in: | Microelectronics and reliability 1996, Vol.36 (5), p.645-650 |
|---|---|
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 650 |
|---|---|
| container_issue | 5 |
| container_start_page | 645 |
| container_title | Microelectronics and reliability |
| container_volume | 36 |
| creator | Kapur, P.K. Younes, Said |
| description | Several Software Reliability Growth Models (SRGMs) have been developed in the literature assuming the debugging process to be perfect and thus implying that there is one-to-one correspondence between the number of failures observed and errors removed. However, in reality it is possible that the error which is supposed to have been removed may cause a failure again. It may be due to the spawning of a new error because of imperfect debugging. If such a phenomenon exists then the Software Reliability Growth is S-shaped. In this paper, we develop a model which can describe imperfect debugging process and has the inbuilt flexibility of capturing a wide class of growth curves. Earlier attempts of modelling such a process were able to capture only a particular curve. In other words, if a failure observation phenomenon is exponential then the error removal is again modelled by an exponential growth curve. Applicability of the model has been shown on several data sets obtained from different software development projects. |
| doi_str_mv | 10.1016/0026-2714(95)00157-3 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_26196952</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>0026271495001573</els_id><sourcerecordid>26196952</sourcerecordid><originalsourceid>FETCH-LOGICAL-c364t-5bdfccca57c011f631cf7e59e50a74acafe7c62e1cc1a96cd94ea31f75ed32f43</originalsourceid><addsrcrecordid>eNp9kE1LAzEQhoMoWKv_wMMeRPSwmmw2SXMRpPgFFS8K3kI6O6mR_ajJVum_N2tLjx5CIPPMvJOHkFNGrxhl8prSQuaFYuWFFpeUMqFyvkdGbKKKXJfsfZ-MdsghOYrxk1KqKGMjMn3uKqxr3y4y22a-WWJwCH1W4Xy1WAzPyw9suyadVG6z2Ln-xwbMAtbezn3t-_UxOXC2jniyvcfk7f7udfqYz14enqa3sxy4LPtczCsHAFYoSNFOcgZOodAoqFWlBetQgSyQATCrJVS6RMuZUwIrXriSj8n5Zu4ydF8rjL1pfIS0vW2xW0VTSKalFkUCyw0IoYsxoDPL4Bsb1oZRMxgzgw4z6DBamD9jhqe2s-18G8HWLtgWfNz1ckYpn4iE3WwwTH_99hhMBI8tYOVDUmeqzv-f8wubboCa</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>26196952</pqid></control><display><type>article</type><title>Modelling an imperfect debugging phenomenon in software reliability</title><source>ScienceDirect Journals (5 years ago - present)</source><creator>Kapur, P.K. ; Younes, Said</creator><creatorcontrib>Kapur, P.K. ; Younes, Said</creatorcontrib><description>Several Software Reliability Growth Models (SRGMs) have been developed in the literature assuming the debugging process to be perfect and thus implying that there is one-to-one correspondence between the number of failures observed and errors removed. However, in reality it is possible that the error which is supposed to have been removed may cause a failure again. It may be due to the spawning of a new error because of imperfect debugging. If such a phenomenon exists then the Software Reliability Growth is S-shaped. In this paper, we develop a model which can describe imperfect debugging process and has the inbuilt flexibility of capturing a wide class of growth curves. Earlier attempts of modelling such a process were able to capture only a particular curve. In other words, if a failure observation phenomenon is exponential then the error removal is again modelled by an exponential growth curve. Applicability of the model has been shown on several data sets obtained from different software development projects.</description><identifier>ISSN: 0026-2714</identifier><identifier>EISSN: 1872-941X</identifier><identifier>DOI: 10.1016/0026-2714(95)00157-3</identifier><identifier>CODEN: MCRLAS</identifier><language>eng</language><publisher>Oxford: Elsevier Ltd</publisher><subject>Applied sciences ; Computer science; control theory; systems ; Exact sciences and technology ; Software ; Software engineering</subject><ispartof>Microelectronics and reliability, 1996, Vol.36 (5), p.645-650</ispartof><rights>1996</rights><rights>1996 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c364t-5bdfccca57c011f631cf7e59e50a74acafe7c62e1cc1a96cd94ea31f75ed32f43</citedby><cites>FETCH-LOGICAL-c364t-5bdfccca57c011f631cf7e59e50a74acafe7c62e1cc1a96cd94ea31f75ed32f43</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/0026-2714(95)00157-3$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,777,781,3537,4010,27904,27905,27906,45976</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=3100385$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Kapur, P.K.</creatorcontrib><creatorcontrib>Younes, Said</creatorcontrib><title>Modelling an imperfect debugging phenomenon in software reliability</title><title>Microelectronics and reliability</title><description>Several Software Reliability Growth Models (SRGMs) have been developed in the literature assuming the debugging process to be perfect and thus implying that there is one-to-one correspondence between the number of failures observed and errors removed. However, in reality it is possible that the error which is supposed to have been removed may cause a failure again. It may be due to the spawning of a new error because of imperfect debugging. If such a phenomenon exists then the Software Reliability Growth is S-shaped. In this paper, we develop a model which can describe imperfect debugging process and has the inbuilt flexibility of capturing a wide class of growth curves. Earlier attempts of modelling such a process were able to capture only a particular curve. In other words, if a failure observation phenomenon is exponential then the error removal is again modelled by an exponential growth curve. Applicability of the model has been shown on several data sets obtained from different software development projects.</description><subject>Applied sciences</subject><subject>Computer science; control theory; systems</subject><subject>Exact sciences and technology</subject><subject>Software</subject><subject>Software engineering</subject><issn>0026-2714</issn><issn>1872-941X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1996</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LAzEQhoMoWKv_wMMeRPSwmmw2SXMRpPgFFS8K3kI6O6mR_ajJVum_N2tLjx5CIPPMvJOHkFNGrxhl8prSQuaFYuWFFpeUMqFyvkdGbKKKXJfsfZ-MdsghOYrxk1KqKGMjMn3uKqxr3y4y22a-WWJwCH1W4Xy1WAzPyw9suyadVG6z2Ln-xwbMAtbezn3t-_UxOXC2jniyvcfk7f7udfqYz14enqa3sxy4LPtczCsHAFYoSNFOcgZOodAoqFWlBetQgSyQATCrJVS6RMuZUwIrXriSj8n5Zu4ydF8rjL1pfIS0vW2xW0VTSKalFkUCyw0IoYsxoDPL4Bsb1oZRMxgzgw4z6DBamD9jhqe2s-18G8HWLtgWfNz1ckYpn4iE3WwwTH_99hhMBI8tYOVDUmeqzv-f8wubboCa</recordid><startdate>1996</startdate><enddate>1996</enddate><creator>Kapur, P.K.</creator><creator>Younes, Said</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>1996</creationdate><title>Modelling an imperfect debugging phenomenon in software reliability</title><author>Kapur, P.K. ; Younes, Said</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-5bdfccca57c011f631cf7e59e50a74acafe7c62e1cc1a96cd94ea31f75ed32f43</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Applied sciences</topic><topic>Computer science; control theory; systems</topic><topic>Exact sciences and technology</topic><topic>Software</topic><topic>Software engineering</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kapur, P.K.</creatorcontrib><creatorcontrib>Younes, Said</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microelectronics and reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kapur, P.K.</au><au>Younes, Said</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Modelling an imperfect debugging phenomenon in software reliability</atitle><jtitle>Microelectronics and reliability</jtitle><date>1996</date><risdate>1996</risdate><volume>36</volume><issue>5</issue><spage>645</spage><epage>650</epage><pages>645-650</pages><issn>0026-2714</issn><eissn>1872-941X</eissn><coden>MCRLAS</coden><abstract>Several Software Reliability Growth Models (SRGMs) have been developed in the literature assuming the debugging process to be perfect and thus implying that there is one-to-one correspondence between the number of failures observed and errors removed. However, in reality it is possible that the error which is supposed to have been removed may cause a failure again. It may be due to the spawning of a new error because of imperfect debugging. If such a phenomenon exists then the Software Reliability Growth is S-shaped. In this paper, we develop a model which can describe imperfect debugging process and has the inbuilt flexibility of capturing a wide class of growth curves. Earlier attempts of modelling such a process were able to capture only a particular curve. In other words, if a failure observation phenomenon is exponential then the error removal is again modelled by an exponential growth curve. Applicability of the model has been shown on several data sets obtained from different software development projects.</abstract><cop>Oxford</cop><pub>Elsevier Ltd</pub><doi>10.1016/0026-2714(95)00157-3</doi><tpages>6</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0026-2714 |
| ispartof | Microelectronics and reliability, 1996, Vol.36 (5), p.645-650 |
| issn | 0026-2714 1872-941X |
| language | eng |
| recordid | cdi_proquest_miscellaneous_26196952 |
| source | ScienceDirect Journals (5 years ago - present) |
| subjects | Applied sciences Computer science control theory systems Exact sciences and technology Software Software engineering |
| title | Modelling an imperfect debugging phenomenon in software reliability |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T02%3A04%3A43IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Modelling%20an%20imperfect%20debugging%20phenomenon%20in%20software%20reliability&rft.jtitle=Microelectronics%20and%20reliability&rft.au=Kapur,%20P.K.&rft.date=1996&rft.volume=36&rft.issue=5&rft.spage=645&rft.epage=650&rft.pages=645-650&rft.issn=0026-2714&rft.eissn=1872-941X&rft.coden=MCRLAS&rft_id=info:doi/10.1016/0026-2714(95)00157-3&rft_dat=%3Cproquest_cross%3E26196952%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=26196952&rft_id=info:pmid/&rft_els_id=0026271495001573&rfr_iscdi=true |