Modelling an imperfect debugging phenomenon in software reliability

Several Software Reliability Growth Models (SRGMs) have been developed in the literature assuming the debugging process to be perfect and thus implying that there is one-to-one correspondence between the number of failures observed and errors removed. However, in reality it is possible that the erro...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Microelectronics and reliability 1996, Vol.36 (5), p.645-650
Hauptverfasser: Kapur, P.K., Younes, Said
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Several Software Reliability Growth Models (SRGMs) have been developed in the literature assuming the debugging process to be perfect and thus implying that there is one-to-one correspondence between the number of failures observed and errors removed. However, in reality it is possible that the error which is supposed to have been removed may cause a failure again. It may be due to the spawning of a new error because of imperfect debugging. If such a phenomenon exists then the Software Reliability Growth is S-shaped. In this paper, we develop a model which can describe imperfect debugging process and has the inbuilt flexibility of capturing a wide class of growth curves. Earlier attempts of modelling such a process were able to capture only a particular curve. In other words, if a failure observation phenomenon is exponential then the error removal is again modelled by an exponential growth curve. Applicability of the model has been shown on several data sets obtained from different software development projects.
ISSN:0026-2714
1872-941X
DOI:10.1016/0026-2714(95)00157-3