Rhenium tips for stable scanning tunneling microscopy

A rhenium (Re) tip has been investigated for scanning tunneling microscopy (STM). Most of the Re tips etched electrochemically from poly-crystalline wires were found to have a [112̄0]-oriented apex by field ion microscopy. A single atom of the tip apex surface has been expected to be stable, because...

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Veröffentlicht in:	Japanese Journal of Applied Physics 1993-09, Vol.32 (9A), p.L1266-L1268
Hauptverfasser:	WATANABE, M. O, KINNO, T
Format:	Artikel
Sprache:	eng
Schlagworte:	Electron, positron and ion microscopes, electron diffractometers and related techniques Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics Scanning probe microscopes, components, and techniques
Online-Zugang:	Volltext
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Zusammenfassung:	A rhenium (Re) tip has been investigated for scanning tunneling microscopy (STM). Most of the Re tips etched electrochemically from poly-crystalline wires were found to have a [112̄0]-oriented apex by field ion microscopy. A single atom of the tip apex surface has been expected to be stable, because of its high coordination number. The 7×7 reconstructions of silicon (111) surfaces were observed at atomic level by STM using the Re tip. These results suggest that a Re tip with a single apex atom can be one of the most stable tips for STM.
ISSN:	0021-4922 1347-4065
DOI:	10.1143/jjap.32.l1266