Optical energy gap measurement of plasma chemical vapor deposition very thin films using evanescent wave

We propose the use of an evanescent field of waveguided light transmitted along a portion of an optical fiber with the cladding removed (a cladless optical fiber) to obtain the optical energy gap ( E o ) of a semiconductor. Through our study of this new method of measurement, it is clarified that E...

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Veröffentlicht in:Japanese Journal of Applied Physics 1993-10, Vol.32 (10A), p.L1474-L1476
Hauptverfasser: TAKEZAWA, N, KATO, I
Format: Artikel
Sprache:eng
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