A novel soft X-ray source ( hν = 151.6 eV) for core level and valence band photoemission spectroscopy with high surface sensitivity

A new soft X-ray source exploiting the Zr MζX-ray transition at hν = 151.6 eV is described. This source yields core level and valence band photoemission spectroscopy with high sensitivity to the surface and to valence s- and p-derived states with respect to the d-derived states. An in situ cleaning...

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Veröffentlicht in:	Journal of electron spectroscopy and related phenomena 1993-05, Vol.62 (4), p.309-316
Hauptverfasser:	Duò, L., De Michelis, B., Fasana, A., Abbati, I., Braicovich, L.
Format:	Artikel
Sprache:	eng
Schlagworte:	Electron, positron and ion microscopes, electron diffractometers and related techniques Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	A new soft X-ray source exploiting the Zr MζX-ray transition at hν = 151.6 eV is described. This source yields core level and valence band photoemission spectroscopy with high sensitivity to the surface and to valence s- and p-derived states with respect to the d-derived states. An in situ cleaning procedure of the anode surface yields a resolution of 1.05 eV full width at half maximum.
ISSN:	0368-2048 1873-2526
DOI:	10.1016/0368-2048(93)85001-2