A method of threshold voltage and current gain factor estimation for CMOS IC input transistors

A method of threshold voltage and current gain factor estimation for CMOS IC input transistors

A statistical technique for input transistor characteristic extraction and transistor threshold voltage and current gain factor estimation for a CMOS IC is presented. The technique is based on the sequential approach to segmented curve estimation. The method enables IC customers to make their own as...

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Veröffentlicht in:Microelectronics and reliability 1993, Vol.33 (13), p.2047-2052
1. Verfasser: Pidin, S.
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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Zusammenfassung:A statistical technique for input transistor characteristic extraction and transistor threshold voltage and current gain factor estimation for a CMOS IC is presented. The technique is based on the sequential approach to segmented curve estimation. The method enables IC customers to make their own assessment of instability mechanisms in CMOS ICs without using special test device structures.
ISSN:0026-2714
1872-941X
DOI:10.1016/0026-2714(93)90363-4