Mapping and Controlling Liquid Layer Thickness in Liquid‐Phase (Scanning) Transmission Electron Microscopy

Liquid‐Phase (Scanning) Transmission Electron Microscopy (LP‐(S)TEM) has become an essential technique to monitor nanoscale materials processes in liquids in real‐time. Due to the pressure difference between the liquid and the microscope vacuum, bending of the silicon nitride (SiNx) membrane windows generally occurs. This causes a spatially varying liquid layer thickness that makes interpretation of LP‐(S)TEM results difficult due to a locally varying achievable resolution and diffusion limitations. To mediate these difficulties, it is shown: 1) how to quantitatively map liquid layer thickness for any liquid at less than 0.01 e− Å−2 total dose; 2) how to dynamically modulate the liquid thickness by tuning the internal pressure in the liquid cell, co‐determined by the Laplace pressure and the external pressure. It is demonstrated that reproducible inward bulging of the window membranes can be realized, leading to an ultra‐thin liquid layer in the central window area for high‐resolution imaging. Furthermore, it is shown that the liquid thickness can be dynamically altered in a programmed way, thereby potentially overcoming the diffusion limitations towards achieving bulk solution conditions. The presented approaches provide essential ways to measure and dynamically adjust liquid thickness in LP‐(S)TEM experiments, enabling new experiment designs and better control of solution chemistry. Real‐time monitoring of nanoscale material processes in liquids by liquid‐phase (scanning) transmission electron microscopy is advanced by rapid dynamic control and quantification of the liquid layer thickness. These methods enable performing the largest part of the experiment using a thick liquid layer to avoid confinement effects and adjusting to a thin liquid layer whenever needed for imaging at higher resolution.