Grazing Incidence Mossbauer Spectroscopy: New Method for Surface Layers Analysis. I. Instrumentation

The aims of this series of papers are to describe a spectrometer for simultaneous investigation of Mossbauer spectra from: (1) specularly reflected gamma -rays, (2) secondary electron, (3) characteristic X-ray, and (4) scattered gamma -rays (part I); to present a general theory of such spectra and to indicate some unusual characteristics and features of Mossbauer spectra at grazing angles (part II); and to give a quantitative analysis of experimental spectra for some exp 57 Fe films which shows that grazing incidence Mossbauer spectroscopy (GIMS) is really a new method of surface investigation (part III).