A complete scheme of built-in self-test (BIST) structure for Fault diagnosis in analog circuits and systems

Automatic testing and fault diagnosis in analog electronic circuits and systems have received considerable attention for more than two decades, and many theoretical methods have been proposed. In the present paper the implementation of BIST in analog circuits is investigated, and a complete BIST scheme is proposed. This scheme may be included in any analog or mixed analog-digital circuit and may check its responses by following selected testing procedures. Furthermore, a CMOS chip supporting the proposed BIST structure is designed to facilitate the application of the scheme in a variety of analog circuits. Demonstrative results from the application of the BIST scheme on active circuits are given, showing its effectiveness and its convenient use.