Automated trace-matrix-separation techniques coupled with simultaneous ICP-AES for trace analysis in refractory metals. A comparison with other techniques

Automated sample introduction systems for ICP-AES and AAS are able to include TMS-procedures applicable for routine analysis, e.g. IC and FIA-systems today enable full automatisation and can be applied for TMS-procedures. For an efficient coupling of sample pretreatment and detection system, a multielement separation and preconcentration together with a simultaneous multielement detection is the answer. Automated analytical procedures for the analysis of traces in high purity Mo and tungsten are possible by coupling IC (HPLC) with simultaneous ICP-AES (SPECTROFLAME-ICP). This "compound system" is compared with other analytical methods like NAA, GDMS and SIMS.