TEM study of the effect of growth interruption in MBE of InGaP/GaAs superlattices
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| Veröffentlicht in: | Journal of electronic materials 1992, Vol.21 (1), p.129-133 |
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| container_end_page | 133 |
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| container_issue | 1 |
| container_start_page | 129 |
| container_title | Journal of electronic materials |
| container_volume | 21 |
| creator | MAHALINGAM, K NAKAMURA, Y OTSUKA, N LEE, H. Y HAFICH, M. J ROBINSON, G. Y |
| description | Article abstract not available. |
| doi_str_mv | 10.1007/BF02670933 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_25912971</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>25912971</sourcerecordid><originalsourceid>FETCH-LOGICAL-c289t-1043f436d3ba55f6dc0f51620df336b0da01bfcf636113385638779519bbe25c3</originalsourceid><addsrcrecordid>eNpFkFFLwzAUhYMoOKcv_oI8iA9C3b3JkraP29jmYEOFCb6VNE1cpWtrkiL793Y49OlwON89XA4htwiPCBCPpgtgMoaU8zMyQDHmESby_ZwMgEuMBOPiklx5_wmAAhMckNftfEN96IoDbSwNO0ONtUaHo_twzXfY0bIOxrmuDWVT94ZupvNjuqqX6mW0VBNPfdcaV6kQSm38NbmwqvLm5qRD8raYb2dP0fp5uZpN1pFmSRoihDG3Yy4LnishrCw0WIGSQWE5lzkUCjC32sr-ceQ8EZIncZwKTPPcMKH5kNz_9rau-eqMD9m-9NpUlapN0_mMiRRZGmMPPvyC2jXeO2Oz1pV75Q4ZQnZcLftfrYfvTq3Ka1VZp2pd-r8LwUDECfAfIFZpzw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>25912971</pqid></control><display><type>article</type><title>TEM study of the effect of growth interruption in MBE of InGaP/GaAs superlattices</title><source>SpringerLink Journals - AutoHoldings</source><creator>MAHALINGAM, K ; NAKAMURA, Y ; OTSUKA, N ; LEE, H. Y ; HAFICH, M. J ; ROBINSON, G. Y</creator><creatorcontrib>MAHALINGAM, K ; NAKAMURA, Y ; OTSUKA, N ; LEE, H. Y ; HAFICH, M. J ; ROBINSON, G. Y</creatorcontrib><description>Article abstract not available.</description><identifier>ISSN: 0361-5235</identifier><identifier>EISSN: 1543-186X</identifier><identifier>DOI: 10.1007/BF02670933</identifier><identifier>CODEN: JECMA5</identifier><language>eng</language><publisher>New York, NY: Institute of Electrical and Electronics Engineers</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Exact sciences and technology ; Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties ; Physics ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><ispartof>Journal of electronic materials, 1992, Vol.21 (1), p.129-133</ispartof><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c289t-1043f436d3ba55f6dc0f51620df336b0da01bfcf636113385638779519bbe25c3</citedby><cites>FETCH-LOGICAL-c289t-1043f436d3ba55f6dc0f51620df336b0da01bfcf636113385638779519bbe25c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,780,784,789,790,4050,4051,23930,23931,25140,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5205780$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>MAHALINGAM, K</creatorcontrib><creatorcontrib>NAKAMURA, Y</creatorcontrib><creatorcontrib>OTSUKA, N</creatorcontrib><creatorcontrib>LEE, H. Y</creatorcontrib><creatorcontrib>HAFICH, M. J</creatorcontrib><creatorcontrib>ROBINSON, G. Y</creatorcontrib><title>TEM study of the effect of growth interruption in MBE of InGaP/GaAs superlattices</title><title>Journal of electronic materials</title><description>Article abstract not available.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties</subject><subject>Physics</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><issn>0361-5235</issn><issn>1543-186X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1992</creationdate><recordtype>article</recordtype><recordid>eNpFkFFLwzAUhYMoOKcv_oI8iA9C3b3JkraP29jmYEOFCb6VNE1cpWtrkiL793Y49OlwON89XA4htwiPCBCPpgtgMoaU8zMyQDHmESby_ZwMgEuMBOPiklx5_wmAAhMckNftfEN96IoDbSwNO0ONtUaHo_twzXfY0bIOxrmuDWVT94ZupvNjuqqX6mW0VBNPfdcaV6kQSm38NbmwqvLm5qRD8raYb2dP0fp5uZpN1pFmSRoihDG3Yy4LnishrCw0WIGSQWE5lzkUCjC32sr-ceQ8EZIncZwKTPPcMKH5kNz_9rau-eqMD9m-9NpUlapN0_mMiRRZGmMPPvyC2jXeO2Oz1pV75Q4ZQnZcLftfrYfvTq3Ka1VZp2pd-r8LwUDECfAfIFZpzw</recordid><startdate>1992</startdate><enddate>1992</enddate><creator>MAHALINGAM, K</creator><creator>NAKAMURA, Y</creator><creator>OTSUKA, N</creator><creator>LEE, H. Y</creator><creator>HAFICH, M. J</creator><creator>ROBINSON, G. Y</creator><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>1992</creationdate><title>TEM study of the effect of growth interruption in MBE of InGaP/GaAs superlattices</title><author>MAHALINGAM, K ; NAKAMURA, Y ; OTSUKA, N ; LEE, H. Y ; HAFICH, M. J ; ROBINSON, G. Y</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c289t-1043f436d3ba55f6dc0f51620df336b0da01bfcf636113385638779519bbe25c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1992</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties</topic><topic>Physics</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>MAHALINGAM, K</creatorcontrib><creatorcontrib>NAKAMURA, Y</creatorcontrib><creatorcontrib>OTSUKA, N</creatorcontrib><creatorcontrib>LEE, H. Y</creatorcontrib><creatorcontrib>HAFICH, M. J</creatorcontrib><creatorcontrib>ROBINSON, G. Y</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of electronic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>MAHALINGAM, K</au><au>NAKAMURA, Y</au><au>OTSUKA, N</au><au>LEE, H. Y</au><au>HAFICH, M. J</au><au>ROBINSON, G. Y</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>TEM study of the effect of growth interruption in MBE of InGaP/GaAs superlattices</atitle><jtitle>Journal of electronic materials</jtitle><date>1992</date><risdate>1992</risdate><volume>21</volume><issue>1</issue><spage>129</spage><epage>133</epage><pages>129-133</pages><issn>0361-5235</issn><eissn>1543-186X</eissn><coden>JECMA5</coden><abstract>Article abstract not available.</abstract><cop>New York, NY</cop><pub>Institute of Electrical and Electronics Engineers</pub><doi>10.1007/BF02670933</doi><tpages>5</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0361-5235 |
| ispartof | Journal of electronic materials, 1992, Vol.21 (1), p.129-133 |
| issn | 0361-5235 1543-186X |
| language | eng |
| recordid | cdi_proquest_miscellaneous_25912971 |
| source | SpringerLink Journals - AutoHoldings |
| subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties Physics Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) |
| title | TEM study of the effect of growth interruption in MBE of InGaP/GaAs superlattices |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T20%3A46%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=TEM%20study%20of%20the%20effect%20of%20growth%20interruption%20in%20MBE%20of%20InGaP/GaAs%20superlattices&rft.jtitle=Journal%20of%20electronic%20materials&rft.au=MAHALINGAM,%20K&rft.date=1992&rft.volume=21&rft.issue=1&rft.spage=129&rft.epage=133&rft.pages=129-133&rft.issn=0361-5235&rft.eissn=1543-186X&rft.coden=JECMA5&rft_id=info:doi/10.1007/BF02670933&rft_dat=%3Cproquest_cross%3E25912971%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=25912971&rft_id=info:pmid/&rfr_iscdi=true |