Theoretical study of a potential low-noise semimetal-based avalanche photodetector

The authors present a theoretical analysis of a possible avalanching photodetector (APD)-based on II-VI compound semiconductors. Each unit cell is composed of a HgTe layer, or a similar semimetal, sandwiched between two layers of CdTe and HgCdTe or similar semiconducting materials. The barrier layers are graded so that the leading barrier height is just high enough to eliminate the thermionic emission dark current out of the well. The use of a semimetal within the well has a distinct advantage over a semiconductor, which is that the ionization process is essentially an interband mechanism since the confined carriers within the well lie within the overlapping conduction and valence bands. As a result, the concentration of target carriers is virtually inexhaustible as in a conventional interband device.< >