Stress transmission in silica particulate epoxy composite by X-ray diffraction
Stress on particles in silica particulate epoxy composite under constant load was investigated by X-ray diffraction. Microdeformation of the crystal lattice of silica could be detected as a shift of the X-ray diffraction peak induced by the applied stress. When a tensile stress was applied to the pa...
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Veröffentlicht in: | Polymer (Guilford) 1992, Vol.33 (24), p.5167-5172 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Stress on particles in silica particulate epoxy composite under constant load was investigated by X-ray diffraction. Microdeformation of the crystal lattice of silica could be detected as a shift of the X-ray diffraction peak induced by the applied stress. When a tensile stress was applied to the particulate composite, incorporated particles were found to be subjected to a stress several times larger than the applied stress. The stress concentration onto particles in particulate composite material, which was considered to result in a mechanical reinforcement of the composite, depends on the volume fraction and size of particles. Quantitative relationships between the stress concentration coefficient, particle diameters and the increment of macroscopic Young's modulus with the incorporation of filler were stated. |
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ISSN: | 0032-3861 1873-2291 |
DOI: | 10.1016/0032-3861(92)90796-Y |