Epitaxial growth of iron and vanadium films vacuum-evaporated onto a copper buffer layer

Epitaxial growth of iron and vanadium films vacuum-evaporated onto a copper (111) buffer layer was examined by transmission electron microscopy. In order to reveal fine details of each film, an ion-milling system was effectively applied. The pseudomorphism of thin iron films evaporated onto copper was discussed according to the electron diffraction pattern and moiré fringes observed in two-layer films. The coexistence of two typical orientation relationships between bcc and fcc metal films, namely Kurdjumov-Sachs and Nishiyama-Wassermann orientations, and continuous distribution between them were confirmed by electron diffraction patterns for two-layer films, Fe/Cu and V/Cu.