Properties of CdTe/InSb heterostructures grown by temperature gradient vapor transport deposition
Heteroepitaxial films of CdTe were grown by a simple method of temperature gradient vapor transport deposition in InSb(1 1 1) orientation substrates in the growth temperature range between 180°C and 280°C. Double crystal X-ray diffraction was used to evaluate the crystal quality of the CdTe epitaxia...
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Veröffentlicht in: | Solid state communications 1992, Vol.83 (11), p.927-930 |
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container_title | Solid state communications |
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creator | Kim, T.W. Jung, M. Chung, I.H. Lee, J.H. Park, H.L. |
description | Heteroepitaxial films of CdTe were grown by a simple method of temperature gradient vapor transport deposition in InSb(1 1 1) orientation substrates in the growth temperature range between 180°C and 280°C. Double crystal X-ray diffraction was used to evaluate the crystal quality of the CdTe epitaxial films. The full width at half-maximum intensity of the double crystal diffraction CdTe peak was as small as 30 arcsec. Room temperature capacitance-voltage measurements showed the nominally undoped CdTe layers to be
n-type with
N
d
N
a
in the low 10
16 cm
−3 region and excellent confinement of electrons at the CdTe/InSb heterointerfaces. Photoluminescence measurements at 15 K showed that the CdTe film grown on InSb(1 1 1) at 230°C appeared to have strong and sharp exciton transitions and weak defect-related bands. |
doi_str_mv | 10.1016/0038-1098(92)90913-T |
format | Article |
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n-type with
N
d
N
a
in the low 10
16 cm
−3 region and excellent confinement of electrons at the CdTe/InSb heterointerfaces. Photoluminescence measurements at 15 K showed that the CdTe film grown on InSb(1 1 1) at 230°C appeared to have strong and sharp exciton transitions and weak defect-related bands.</description><identifier>ISSN: 0038-1098</identifier><identifier>EISSN: 1879-2766</identifier><identifier>DOI: 10.1016/0038-1098(92)90913-T</identifier><identifier>CODEN: SSCOA4</identifier><language>eng</language><publisher>Oxford: Elsevier Ltd</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Exact sciences and technology ; Physics ; Solid surfaces and solid-solid interfaces ; Surface and interface dynamics and vibrations ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology</subject><ispartof>Solid state communications, 1992, Vol.83 (11), p.927-930</ispartof><rights>1992</rights><rights>1992 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c364t-f7d3ce4a5c61bb70be897bfd25c6c51a3c23a17d2b8b5bdc840b2d055da843833</citedby><cites>FETCH-LOGICAL-c364t-f7d3ce4a5c61bb70be897bfd25c6c51a3c23a17d2b8b5bdc840b2d055da843833</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/003810989290913T$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3536,4009,27902,27903,27904,65309</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5550068$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Kim, T.W.</creatorcontrib><creatorcontrib>Jung, M.</creatorcontrib><creatorcontrib>Chung, I.H.</creatorcontrib><creatorcontrib>Lee, J.H.</creatorcontrib><creatorcontrib>Park, H.L.</creatorcontrib><title>Properties of CdTe/InSb heterostructures grown by temperature gradient vapor transport deposition</title><title>Solid state communications</title><description>Heteroepitaxial films of CdTe were grown by a simple method of temperature gradient vapor transport deposition in InSb(1 1 1) orientation substrates in the growth temperature range between 180°C and 280°C. Double crystal X-ray diffraction was used to evaluate the crystal quality of the CdTe epitaxial films. The full width at half-maximum intensity of the double crystal diffraction CdTe peak was as small as 30 arcsec. Room temperature capacitance-voltage measurements showed the nominally undoped CdTe layers to be
n-type with
N
d
N
a
in the low 10
16 cm
−3 region and excellent confinement of electrons at the CdTe/InSb heterointerfaces. Photoluminescence measurements at 15 K showed that the CdTe film grown on InSb(1 1 1) at 230°C appeared to have strong and sharp exciton transitions and weak defect-related bands.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><subject>Solid surfaces and solid-solid interfaces</subject><subject>Surface and interface dynamics and vibrations</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><issn>0038-1098</issn><issn>1879-2766</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1992</creationdate><recordtype>article</recordtype><recordid>eNp9kEtLJDEUhYOMYI_6D1zUQkQXNeZRqSQbQRp1BGEE23XI45ZGuitlklb896ZtcTmrezn5zg3nIHRE8B-CSX-OMZMtwUqeKnqmsCKsXeygGZFCtVT0_S80-0H20O-cXzDGQgoyQ-Y-xQlSCZCbODRzv4Dz2_HBNs9QIMVc0tqVdaqvTym-j439aAqsqsNs1CoaH2AszZuZYmpKMmOuS2k8TDGHEuJ4gHYHs8xw-D330eP11WL-t737d3M7v7xrHeu70g7CMwed4a4n1gpsQSphB0-r4DgxzFFmiPDUSsutd7LDlnrMuTeyY5KxfXSyvTul-LqGXPQqZAfLpRkhrrOmXFKlRFfBbgu6mi8nGPSUwsqkD02w3vSpN2XpTVlaUf3Vp15U2_H3fZOdWQ41qgv5x8s5x7iXFbvYYlCzvgVIOrvakAMfEriifQz__-cThKOMOA</recordid><startdate>1992</startdate><enddate>1992</enddate><creator>Kim, T.W.</creator><creator>Jung, M.</creator><creator>Chung, I.H.</creator><creator>Lee, J.H.</creator><creator>Park, H.L.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>1992</creationdate><title>Properties of CdTe/InSb heterostructures grown by temperature gradient vapor transport deposition</title><author>Kim, T.W. ; Jung, M. ; Chung, I.H. ; Lee, J.H. ; Park, H.L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-f7d3ce4a5c61bb70be897bfd25c6c51a3c23a17d2b8b5bdc840b2d055da843833</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1992</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><topic>Solid surfaces and solid-solid interfaces</topic><topic>Surface and interface dynamics and vibrations</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kim, T.W.</creatorcontrib><creatorcontrib>Jung, M.</creatorcontrib><creatorcontrib>Chung, I.H.</creatorcontrib><creatorcontrib>Lee, J.H.</creatorcontrib><creatorcontrib>Park, H.L.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Solid state communications</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kim, T.W.</au><au>Jung, M.</au><au>Chung, I.H.</au><au>Lee, J.H.</au><au>Park, H.L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Properties of CdTe/InSb heterostructures grown by temperature gradient vapor transport deposition</atitle><jtitle>Solid state communications</jtitle><date>1992</date><risdate>1992</risdate><volume>83</volume><issue>11</issue><spage>927</spage><epage>930</epage><pages>927-930</pages><issn>0038-1098</issn><eissn>1879-2766</eissn><coden>SSCOA4</coden><abstract>Heteroepitaxial films of CdTe were grown by a simple method of temperature gradient vapor transport deposition in InSb(1 1 1) orientation substrates in the growth temperature range between 180°C and 280°C. Double crystal X-ray diffraction was used to evaluate the crystal quality of the CdTe epitaxial films. The full width at half-maximum intensity of the double crystal diffraction CdTe peak was as small as 30 arcsec. Room temperature capacitance-voltage measurements showed the nominally undoped CdTe layers to be
n-type with
N
d
N
a
in the low 10
16 cm
−3 region and excellent confinement of electrons at the CdTe/InSb heterointerfaces. Photoluminescence measurements at 15 K showed that the CdTe film grown on InSb(1 1 1) at 230°C appeared to have strong and sharp exciton transitions and weak defect-related bands.</abstract><cop>Oxford</cop><pub>Elsevier Ltd</pub><doi>10.1016/0038-1098(92)90913-T</doi><tpages>4</tpages></addata></record> |
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subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Solid surfaces and solid-solid interfaces Surface and interface dynamics and vibrations Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology |
title | Properties of CdTe/InSb heterostructures grown by temperature gradient vapor transport deposition |
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