Laser processing of amorphous silicon for large-area polysilicon imagers
Pulsed excimer-laser processing of amorphous silicon on non-crystalline substrates allows for the fabrication of high-quality polysilicon materials and thin-film transistors (TFTs). Under optimized processing conditions, these polysilicon TFTs have high mobilities, sharp turn-on, low off-state leaka...
Gespeichert in:
Veröffentlicht in: | Thin solid films 2001-02, Vol.383 (1-2), p.137-142 |
---|---|
Hauptverfasser: | , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Pulsed excimer-laser processing of amorphous silicon on non-crystalline substrates allows for the fabrication of high-quality polysilicon materials and thin-film transistors (TFTs). Under optimized processing conditions, these polysilicon TFTs have high mobilities, sharp turn-on, low off-state leakage currents and good spatial uniformity. These improved parameters, particularly the low off-state leakage currents and good uniformity, enable, not only displays, but also the more demanding flat-panel imaging arrays to be fabricated in polysilicon, and results on an imager are presented. |
---|---|
ISSN: | 0040-6090 1879-2731 |
DOI: | 10.1016/S0040-6090(00)01585-6 |