Probability of survival and stress distribution of narrow diameter implants with different implant–abutment taper angles

This study evaluated the probability of survival, failure mode, and stress distribution of narrow diameter implants (NDIs) with internal implant–abutment conical connection comprised of different taper angles and thread designs. Sixty‐three NDIs (Ø 3.5 × 8.5 mm) were divided according to the taper angle (TA), internal diameter (ID), and trapezoidal thread design (TD) (n = 21/group), as follows: (a) 11.5°U (11.5° TA; ID: 2.5 mm; TD: dual threaded); (b) 11.5°S (11.5° TA; ID: 2.5 mm; TD: single threaded); (c) 16°S (16° TA; ID: 2.72 mm; TD: single threaded). They were subjected to step‐stress accelerated life testing. The reliability and use‐level probability Weibull curves were calculated at 50, 100, and 150 N for a mission of 100,000 cycles and the failure mode was analyzed using a scanning electron microscope. For finite element analysis the von‐Mises stress (σvM) was calculated for the abutment and implant. All groups showed high reliability (above 84%) and failures occurred predominantly in the abutment. In the FEA, 11.5°U showed higher σvM for the implant. All NDIs showed high reliability at clinically challenging loads. The system with greater taper angle showed lower σVm in the implant, and dual threaded implants showed a higher stress concentration in the implant and cortical bone.