Measurement of electrooptic and electrogyratory effects in Bi sub 1 sub 2 TiO sub 2 sub 0
Measurements are reported at 633 nm in transverse and longitudinal electric field geometrics. For each geometry, dc and ac results are presented. Results are compared with other investigations.
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Veröffentlicht in: | Journal of applied physics 1990-01, Vol.67 (5), p.2245-2252 |
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container_title | Journal of applied physics |
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creator | Wilde, J P Hesselink, L McCahon, S W |
description | Measurements are reported at 633 nm in transverse and longitudinal electric field geometrics. For each geometry, dc and ac results are presented. Results are compared with other investigations. |
format | Article |
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identifier | ISSN: 0021-8979 |
ispartof | Journal of applied physics, 1990-01, Vol.67 (5), p.2245-2252 |
issn | 0021-8979 |
language | eng |
recordid | cdi_proquest_miscellaneous_25752802 |
source | AIP Digital Archive |
title | Measurement of electrooptic and electrogyratory effects in Bi sub 1 sub 2 TiO sub 2 sub 0 |
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