Measurement of electrooptic and electrogyratory effects in Bi sub 1 sub 2 TiO sub 2 sub 0

Measurements are reported at 633 nm in transverse and longitudinal electric field geometrics. For each geometry, dc and ac results are presented. Results are compared with other investigations.

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Veröffentlicht in:Journal of applied physics 1990-01, Vol.67 (5), p.2245-2252
Hauptverfasser: Wilde, J P, Hesselink, L, McCahon, S W
Format: Artikel
Sprache:eng
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Zusammenfassung:Measurements are reported at 633 nm in transverse and longitudinal electric field geometrics. For each geometry, dc and ac results are presented. Results are compared with other investigations.
ISSN:0021-8979