Measurement of electrooptic and electrogyratory effects in Bi sub 1 sub 2 TiO sub 2 sub 0
Measurements are reported at 633 nm in transverse and longitudinal electric field geometrics. For each geometry, dc and ac results are presented. Results are compared with other investigations.
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Veröffentlicht in: | Journal of applied physics 1990-01, Vol.67 (5), p.2245-2252 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Measurements are reported at 633 nm in transverse and longitudinal electric field geometrics. For each geometry, dc and ac results are presented. Results are compared with other investigations. |
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ISSN: | 0021-8979 |