Free volume and relaxation effects in polymer layers: application to the spin coating and bake processes
The variations in free volume of polymer layers can be observed using simple plasma etching techniques along with laser interferometry monitoring. During oxygen plasma etching, the polymer layers are heated and may undergo volume relaxation. Thus, polymers can be classified according to their relati...
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Veröffentlicht in: | Microelectronic engineering 1990, Vol.11 (1), p.469-472 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | The variations in free volume of polymer layers can be observed using simple plasma etching techniques along with laser interferometry monitoring. During oxygen plasma etching, the polymer layers are heated and may undergo volume relaxation. Thus, polymers can be classified according to their relative relaxation response. This technique appears to be a simple way of monitoring the baking conditions of lithographic layers. |
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ISSN: | 0167-9317 1873-5568 |
DOI: | 10.1016/0167-9317(90)90153-K |