Lock-on effect in pulsed-power semiconductor switches
Certain high-voltage pulsed-power switches based on semi-insulating GaAs or InP exhibit a ‘‘lock-on’’ effect. In this paper, this effect is argued to be fundamentally a transferred-electron effect, and its experimentally observed characteristics are explained. The lock-on effect causes high forward...
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Veröffentlicht in: | Journal of applied physics 1992-03, Vol.71 (6), p.3036-3038 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | Certain high-voltage pulsed-power switches based on semi-insulating GaAs or InP exhibit a ‘‘lock-on’’ effect. In this paper, this effect is argued to be fundamentally a transferred-electron effect, and its experimentally observed characteristics are explained. The lock-on effect causes high forward drop and high power dissipation for certain pulsed-power switches based on GaAs and various other direct-gap materials. |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.350988 |